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Large storage case
MP-100.13Z
Large storage case
MP-100.13ZLarge storage case
MP-100.13Z

Large storage case
MP-100.13Z

for safe transport and storage of the test probes

Content depending on the order.

  • Equipment

IEC-Joint Finger Probe MP-P10.14

according with VDE 0470,
part 2, pic. 2, probe B
resp. IEC/EN 61032

Details

Fingernail Probe MP-P10.41

to attach all ∅ 12mm test fingers and probes according to VDE 0700, part 1, pic. 7

Details

Rigid Finger Probe MP-P10.15

according to IEC 60950,
section 2.1.1.1
but with a rigid finger probe

Details

Rigid Finger Probe MP-P10.05

according VDE 0470, part 2, pic. 7, probe 11 resp. IEC/EN 61032

Details

Cone Test Pin MP-100.04N

according VDE 0470, part 2, pic. 9, probe 13 resp. IEC/EN 61032

Details

Access Probe (back of Hand) MP-100.04F

according VDE 0470,
part 2, pic. 1, probe A
resp. IEC/EN 61032

Details

Test Hook MP-P10.40

according VDE 0860, pic. 4 resp. IEC/EN 60065

Details

Rigid Finger Probe with Compression Spring MP-P10.39

with force scale from 0 ... 100 N in 10 N steps, according VDE 0470, part 2, pic. 7, probe 11 resp. IEC/EN 61032

Details

Test Mandrel MP-P10.59

∅ 6 mm, with 90° tip, 80 mm long

Details

Cone Test Pin MP-100.04M

according VDE 0470, part 2, pic. 8, probe 12 resp. IEC/EN 61032

Details

Test Sphere MP-100.04H

∅ 50 mm, according VDE 0470, part 2, picture 5, probe 1 resp. IEC/EN 61032

Details

Test Sphere MP-100.04K

∅ 12,5 mm, according VDE 0470, part 2, pic. 6, probe 2 resp. IEC/EN 61032

Details

Test Sphere MP-100.04L

∅ 50 mm, according VDE 0470, part 2, pic. 5, probe 1 resp. IEC/EN 61032

Details

Access and object probe MP-100.04G

according VDE 0470, part 2, pic. 4, probe C resp. IEC/EN 61032

Details